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Posts Tagged ‘Park Systems’

The Week in Review: April 4, 2014

Friday, April 4th, 2014

Park Systems this week introduced the Automatic Defect Review AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000 percent.

ON Semiconductor announced this week that it will acquire Trusense Imaging, Inc. ON Semiconductor will pay approximately $92 million in cash to acquire Truesense Imaging.

SureCore announced that early testing of its innovative low power SRAM design confirms its simulations that deliver in excess of 50 percent power savings over other SRAM technologies.

Researchers from Georgia Tech, University of Texas at Austin, and the Raytheon Company have developed a thermal interface material able to conduct heat 20 times better than the original polymer. The modified material can reliably operate at temperatures of up to 200 degrees Celsius.

UVOTECH announced the release of the UV Ozone Cleaning solution. The UV Ozone Cleaning process is a photo-sensitized oxidation process in which the contaminant molecules of photo resists, resins, human skin oil, cleaning solvent residues, silicone oils, and flux are excited and/or dissociated by the absorption of short wavelength UV radiation.

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