Zvi Or-Bach, president and CEO of MonolithIC 3D, blogs about a recent announcement by Intel CEO Brian Krzanich on company expansion focused on a foundry plan. Or-Bach said that if Intel could keep the traditional 30% cost reduction per node from 28nm to 10nm, and the foundry’s cost per transistor is staying flat, then Intel would be able to provide their foundry customers SoC products at a third of the other foundries cost, and accordingly Intel should be able to do very well in its foundry business.
Vivek Bakshi, EUV Litho, Inc. reports on work presented at the 2013 Source Workshop (Nov 3-7, 2013, Dublin, Ireland), including data on the readiness of 50 W EUV sources to support EUVL scanners. At the meeting, keynoter Vadim Banine of ASML said that 50 W EUV sources have now demonstrated good dose control and are now available for deployment in the field. ASML also presented data on the feasibility of source power of 175 W at the first focus (720 W at source), and utilizing new, protective cap layers to give collectors six months of life.
At the GaTech Global Interposer Technology Workshop (GIT) in Atlanta, the pervasive theme appeared to be whether a change in substrate is required to lower overall costs and help drive HVM (high volume manufacturing) applications. Phil Garrou reports on the workshop, including presentations from Ron Huemoeller of Amkor and David McCann of GLOBALFOUNDRIES.
Pete Singer provides a preview of a special focus session at the upcoming IEEE International Electron Devices Meeting (IEDM), scheduled for December 9 – 11, 2013. The session covers many of today’s hot topics: memory, LEDs, silicon photonics, interposers, SOI finFETS and 450mm.
Dr. Lianfeng Yang of ProPlus Design Solutions, Inc., blogs that these days, circuit designers are talking about the increasing giga-scale circuit size. Semiconductor CMOS technology downscaled to nano-scale, forcing the move to make designing for yield (DFY) mandatory and compelling them to re-evaluate how they design and verify their chips.