Who, What And Why?
Our mission, our goals, why you’re receiving this publication, and what to expect from us in the future.
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In This Issue — February 15, 2011Top Stories/FeaturesWho, What And Why?Our mission, our goals, why you’re receiving this publication, and what to expect from us in the future. Experts At The Table: 3D StackingFirst of three parts: The importance of through-silicon vias; the available of tools and standards; best guesses for how the technology will roll out. TSMC’s Chang Makes 450-mm Pilot Line Move
ISMI 450 Program Moves to Albany, Expands Goals
Partners Test UTB-SOI for Mobile Applications
Chenming Hu Welcomes FinFET vs. UTB-SOI Race
Not Your Father’s DFMUsing feedback mechanisms among a variety of EDA tool flows would allow designers to optimize incremental tapeouts to the benefit of the entire design-manufacturing ecosystem. IEDM Shows Air-gaps By DesignAir-gaps to lower dielectric constant of electrical insulating layers in 25nm MLC NAND Flash ICs designed by Micron and Intel, after Micron, Samsung, Toshiba used air-gaps accidentally. Qualcomm Shies Away from High-k at 28nmQualcomm CDMA Technologies said it will not use a high-k/metal gate (HKMG) process for most of the chips it makes at the 28nm node, sticking with a poly/SiON gate stack. The company described the rationale behind the strategy — which because of Qualcomm’s size will have a major impact on the foundry business — at the 2010 International Electron Devices Meeting (IEDM) held in San Francisco. Race Intensifies to Develop EUV SourceThe technology competition to supply the source of EUV radiation for the next-generation lithography tools has long been divided between the laser-produced plasma (LPP) approach, favored by Cymer Inc. (San Diego) and Gigaphoton Inc. (Oyama, Japan), and the discharge-produced plasma (DPP) method supported by Xtreme Technologies GmbH (Aachen, Germany). FinFETs vs ETSOI Debate Heats UpSemiconductor technologists face a crossroads at the 14nm node, when partially depleted, planar transistors are unlikely to deliver improvements in performance and power. Technologists at the recent International Electron Devices Meeting (IEDM) in San Francisco debated the relative merits of FinFETs (tall) versus extremely thin silicon on insulator, or ETSOI (thin). NewsPV Materials Offer OpportunitiesThe burgeoning market for chemicals and materials used in solar cells and modules is expected to grow to $16.9 billion in 2015, up from $6.5 billion in 2010, according to a jointly prepared report from SEMI and Linx-AEI Consulting… SEMI: Wafer Shipments Reach Record Levels in 2010SEMI’s Silicon Manufacturers Group (SMG) reported that worldwide silicon wafer area shipments increased by 40 percent in 2010 over the previous year. In its year-end analysis of the silicon wafer industry, SMG said revenues also improved by 45 percent last… Veeco Riding MaxBright into Billion Dollar Club
Sematech Knowledge Series Meetings Announced
Rudolph Technologies Sees Growth Prospects in 2011Rudolph Technologies, Inc. (Flanders, N.J.) CEO Paul McLaughlin said the company’s inspection tools for advanced packages used in smart phones helped drive strong growth in 2010. And he said Rudolph’s inspection and metrology sales picture for 2011 is brightened by… Podcasts/Videos/Webcasts3D Stacking: Reality CheckJust how real is 3D stacking and what are the main hurdles that need to be solved? Blogs/Twitter
White PapersMetric Pitch BGA And Micro BGA Routing SolutionsVia fanout and trace routing solutions for metric pitch ball grid array packages. Design Impacts of Fully Depleted SOIXavier Cauchy, digital applications manager at Soitec, describes the design implications of fully depleted SOI technology at the 22/20 nm node. Frequently Asked Questions About FD-SOIXavier Cauchy of Soitec and François Andrieu at LETI raise some of the technical issues surrounding fully depleted SOI technology. The authors compare FD-SOI to FinFETs, describe how non-digital transistors can be handled, and provide a list of references for further reading. Manufacturing Closure with Calibre InRoute and Olympus-SoCThis Mentor Graphics paper describes the physical signoff challenges seen in advanced node designs. |
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