Flagello to receive Zernike Award at SPIE Advanced Lithography
Donis Flagello, president, CEO, and COO of Nikon Research Corporation of America (NRCA), will be presented with the 2017 Frits Zernike Award for Microlithography on Monday 27 February during SPIE Advanced Lithography in San Jose, California. The award, presented annually for outstanding accomplishments in microlithography technology, recognizes Flagello’s leading role in understanding and improving image formation in optical lithography for semiconductor manufacturing.
A prominent member of the industry since the early 1980s and a longtime SPIE Fellow, Flagello has primarily focused on the rigorous application of physics to lithography modeling and problem solving. Early in his career, while at IBM T.J. Watson Research Center, he developed the first practical test for measuring flare in optical lithography tools and made major contributions to high numerical aperture (NA) modeling including vector and polarization effects, and radiometric correction. At ASML he played an important role in providing analysis of aberrations for new systems and high-NA imaging effects due to polarization.
Another notable aspect of his career, Flagello’s presentations at lithography conferences and papers in various journals have inspired a better understanding of optics and resist behavior and helped drive optical lithography forward, colleagues said. “His presentations are known for their combination of humor with a deep understanding of the complex interactions between physical optics and lithographic process technology,” said David Williamson, an NRCA Fellow and previous Frits Zernike Award winner. “His combined theoretical and practical production experience and knowledge are rare in this field.”