Posts Tagged ‘22nm’

EUV Flare And Proximity Modeling And Model-Based Correction

Thursday, May 16th, 2013

The introduction of EUV lithography into the semiconductor fabrication process will enable a continuation of Moore’s law below the 22 nm technology node. EUV lithography will, however, introduce new and unwanted sources of patterning distortions which must be accurately modeled and corrected on the reticle. Flare caused by scattered light in the projection optics is expected to result in several nanometers of on-wafer dimensional variation, if left uncorrected. Previous work by the authors has focused on combinations of model-based and rules-based approaches to modeling and correction of flare in EUV lithography. This paper focuses on the development of an all model-based approach to compensation of both flare and proximity effects in EUV lithography. The advantages of such an approach in terms of both model and OPC accuracy will be discussed. In addition, the authors will discuss the benefits and tradeoffs associated with hybrid OPC approaches which mix both rules-based.

To view this white paper, click here.

The Week In Review: May 6

Monday, May 6th, 2013

By Mark LaPedus
Enterprise-based bring your own device (BYOD) programs continue to become more commonplace. In fact, 38% of companies expect to stop providing devices to workers by 2016, according to a global survey of CIOs by Gartner.

What would happen if half of all global DRAM production, two-thirds of NAND flash manufacturing and 70% of the world’s tablet display supply suddenly disappeared from the market? For high-tech companies, this could be the outcome if current tensions escalate to the point of war on the Korean peninsula, resulting in the disruption of South Korea’s technology manufacturing base, says IHS iSuppli.

Intel telegraphed its future directions. The chip giant has named Brian Krzanich as its next chief executive, succeeding Paul Otellini. Krzanich, Intel’s chief operating officer since January 2012, will become the sixth CEO in Intel’s history. As announced, Otellini will step down as CEO. In a research note, Hans Mosesmann, an analyst with Raymond James, said: “We are not entirely shocked by the news but note that some investors preferred an external option on the belief that new blood was needed. Giving Krzanich’s manufacturing background we think the appointment is an indication that Intel will continue Paul Otellini’s strategy of building bigger/better fabs to attack the market. We also believe the move toward better manufacturing processes (like the 450mm transition) will remain front and center.” Added RBC Capital analyst Doug Freedman: “The move to appoint Renee James (as president) is likely in support of the vision of Krzanich’s and the board has laid out for the future of Intel. This appointment validates the increasing importance of on-going software development to Intel’s future, whether it be internally or in collaboration with partners.”

Microsemi has inked a foundry deal with Intel. Microsemi is currently engaged with customers and has started designs utilizing Intel’s 22nm tri-gate technology. Product delivery is anticipated to begin in late 2014 to early 2015.

Infineon and GlobalFoundries announced a joint technology development and production agreement for 40nm embedded flash (eFlash) process technology. The cooperation will focus on technology development based on Infineon’s eFlash cell design and manufacturing of automotive and security microcontrollers with 40nm process structures.

GlobalFoundries has collaborated with Cadence to provide pattern classification data for manufacturing processes of 20nm and 14nm. GlobalFoundries is using the Cadence Pattern Classification and Pattern Matching Solutions.

SEMI announced that Philip Yeo, chairman of Spring Singapore, and Lee Kok Choy, country manager of Micron Technology Singapore, have been voted by the SEMI Singapore Regional Advisory Board as recipients of two prestigious awards recognizing their contributions to the development and success of the Southeast Asian semiconductor industry. The awards will be presented during festivities held at Semicon Singapore 2013 on May 7.

Soitec has finalized a ZAR 1,000,000,000 (more than $100 million) solar financing bond issued by CPV Power Plant No.1 Bond SPV, an affiliate of Soitec Solar GmbH. The bonds will finance the construction of a 44 MWp utility-scale concentrator photovoltaic (CPV) solar power plant in Touwsrivier, South Africa.

Applied Materials and The Center for Science Teaching and Learning (CSTL) announced the San Francisco Bay Area grand-prize winning team and nine finalist teams in the 2013 Clean Tech Competition.

Rudolph has purchased selected assets related to 3D metrology from Tamar Technology.

Proteus Digital Health has completed a second closing of its Series F financing, raising $62.5 million in total. New corporate investor Oracle joins Otsuka, Novartis, Sino Portfolio and others in this funding round. Proteus is working to create a new category of products. Called Digital Medicines, these new pharmaceuticals will contain a tiny sensor that can communicate, via a digital health feedback system, vital information about an individual’s medication-taking behavior and how their body is responding.

Is Mindspeed Technologies on the block? The supplier of semiconductor solutions for communications has retained Morgan Stanley as a financial advisor to assist the board in evaluating various strategic alternatives available to the company.

Spansion has acquired the microcontroller and analog business of Fujitsu Semiconductor for approximately $110 million, plus approximately $65 million for inventory.

Amkor Technology announced that Stephen Kelley has been appointed to serve as president and CEO. He succeeds Ken Joyce, who previously announced his intention to retire.

ASE remained the world’s largest OSAT in 2012, according to the new rankings from Gartner.

Intel Applies 22nm Technology in Foundry Deal with FPGA Startup Tabula

Tuesday, February 21st, 2012

Continuing a tradition of programmable logic serving as a driver of foundry technology, Tabula Inc. (Santa Clara) said Tuesday (Feb. 21) that it is working with Intel Custom Foundry to manufacture Tabula’s programmable logic devices on Intel’s 22nm tri-gate process.

Intel last year signed up another FPGA house, Achronix, as a foundry customer. With their need for high-density and fast transistors, FPGA vendors have pushed foundries to the next node for several decades. Intel appears to be taking a similar path, working with innovative programmable logic vendors such as Achronix and Tabula which are eager to cut into the markets held by Altera and Xilinx.

Tabula said the combination of its innovative architecture and Intel’s smaller 22nm transistor process will give it a smaller die size and a technology lead over conventional FPGA vendors.

Tabula claims that it uses “time as the third dimension” to reduce the number of components needed to implement a function. Its “Spacetime” programmable fabric delivers an architecture with “dramatically shorter interconnects than traditional FPGAs and the ability to clock the entire fabric – logic, DSP, memory, and interconnect — at the same frequency.”

Tabula and Intel have been working together for some time prior to the public announcement, including an effort to co-optimize packaging technology. Tabula’s products are aimed at network infrastructure systems requiring high-bandwidth data flows such as switches, routers, packet inspection appliances, and other high-performance systems.

Daniel Gitlin, Tabula’s manufacturing vice president, is expected to discuss his company’s technology further on Wednesday at the Ethernet Technology Summit in San Jose. In a press release, Gitlin said the foundry relationship with Intel “will provide our company with a head start of several years, much as Intel achieved in 2007 by introducing high-k metal-gate (HKMG) transistors at the 45nm node.”

Sunit Rikhi, a vice president at Intel’s Technology and Manufacturing Group, said  Intel has worked closely with Tabula throughout the product design cycle to co-optimize Tabula’s 3PLD family with Intel’s 22nm manufacturing process and design kits.

Founded in 2003, Tabula is in volume production with its ABAX family, made on a 40nm process and operating clock speeds of up to 1.6 GHz.

Intel Ups 2012 Capex Budget to $12.5 Billion

Thursday, January 19th, 2012

By David Lammers

Intel Corp. said Thursday its capital spending for 2012 is expected to be $12.5 billion, plus or minus $400 million, with “more than a third” of the 2012 capex going into new buildings aimed largely at 14nm production.

Stacy Smith

Intel chief financial officer Stacy Smith said 2012 equipment spending — separate from fab construction —  is likely to be less than in 2011, when Intel spent $10.8 billion in capital expenditures. While spending on buildings will decline in 2013, overall capital expenditures next year are likely to depend on how many units Intel can sell.

“If there is a big increase in units, capex will go up,” Smith said, adding that represents a “more traditional” approach to capital spending. The major construction projects for the D1X fab in Oregon and Fab 42 in Arizona “will start to taper off” next year, he added. Intel will continue its strategy of having four large fabs ramp volumes at a particular technology node, Smith said during a conference call following release of the company’s Q4 and full year financial results.

CEO Paul Otellini said 2010 was the first year for Intel’s revenues to exceed $40 billion, while sales went past $50 billion for the first time in 2011. Otellini said the 22nm Ivy Bridge products would begin to ship in “early Spring,” which would represent a slight delay from Intel’s normal two-year product cycle. Those products will deliver improved graphics and other performance advantages compared with the company’s 32nm processors, he said.

Intel’s 2011 revenue was $54 billion, up 24% from 2010, and Smith said 2011 was “by far our most profitable year” with net profits of $12.9 billion. The 2011 revenues were $19 billion higher than in 2009, justifying the higher capital expenditures in 2011 and 2012, he said.

Intel is producing its first 22nm wafers now, Smith said, and the per-wafer production costs will follow the normal learning curve. That may allow Intel to have higher margins in the second half as yields improve on its “Core” microprocessors for personal computers and data center products. Intel had more than $10 billion in revenues from ICs sold into data centers, including servers, storage products, and networking.

Smith noted that by adding graphics capabilities to its processors made on the company’s leading-edge process technology, Intel was able to gain revenues which “paid for the higher capex required.”

R&D spending this year is expected to be about $10.1 billion, up 21% from 2011. Intel’s R&D budget, Otellini said, will be aimed across the product spectrum, at processors for Ultrabooks, data centers, smart phones and tablets, with more highly integrated SoCs developed for mobile products.

Israeli Report: Intel Eyes 14nm ramp in Ireland

Monday, September 26th, 2011

By Mark LaPedus, SemiMD senior editor

As it gears up for 22nm production, Intel Corp. is now leaning towards upgrading its 300-mm fab in Ireland for the next-generation 14nm node, according to a report in an Israeli publication, Globes.

According to its latest roadmap, Intel initially plans to manufacture 22nm products in its D1D fab in Oregon, followed by the D1C plant in the same location. The company also plans to ramp 22nm production at three other fabs, including Fab 12 and Fab 32 in Arizona, and Fab 28 in Israel.

Fab 24 reception logo at Intel's Ireland campus.

At one time, Fab 24 in Leixlip, Ireland was targeted to manufacture processors based on the 22nm tri-gate process. But Intel appears to have pushed out 22nm production at the Ireland fab. In a presentation, Intel excluded the fab in Ireland for 22nm production.

Now, according to the Globes report, Intel is mulling plans to ramp up 14nm production at the Ireland fab. The Israeli government apparently made a bid to have Intel ramp up its 14nm production in Fab 28 in Israel or another fab site in that nation, but Intel rejected that plan, according to the report.

“Intel Israel thoroughly reviewed the proposal, and other executives toured the proposed site, including its water and electricity infrastructures and access roads,’’ according to the report from Globes. “A senior government source involved in the talks with Intel told ‘Globes’ today that the company decided to upgrade its Irish fab instead.”

Intel declined to comment on the report. “We have not announced specific sites anywhere outside of the Oregon and (Arizona) for 14nm fabs,” according to a spokesman for Intel.

“We did announce a $500 million investment to prepare Fab 14 for a future technology in January, but the rest of the Globes report is speculative.   Our near term focus is deploying 22nm and the only thing we’ve said about 14nm is that the first high volume fab will be Fab 42 in Arizona, which is under construction,’’ according to the Intel spokesman.

In any case, Intel could lower its capital spending for this year and next. C.J. Muse, an analyst with Barclays Capital, said “specific to Intel, we believe some adjustments in its capacity adds, coupled with its taking Fab 24 off the 22nm roadmap, is likely to drive 2011 capex to $9+ billion (formal guidance $10.5 billion +/-$400 million), with 2012 capex tracking to ~$8 billion,’’ Muse said in a research report.

D2S Introduces TrueMask Mask-Wafer Simulation Tool

Tuesday, September 20th, 2011

By David Lammers

D2S, Inc. has introduced a mask-wafer double simulation tool which employs the graphical acceleration capabilities delivered by GPU-enhanced workstations.

Aki Fujimura

Introduced at the Bacus mask technology conference going on this week in California, the TrueMask DS tool is aimed at mask shops, engineers implementing optical proximity correction (OPC) features, and IC designers, said CEO Aki Fujimura.

Sub-resolution assist features (SRAFs), used to boost the energy received at the wafer level, are become more curvilinear and thus harder for the variable-shaped beam (VSB) e-beam mask writers to handle. “For a long time, e-beam writing has been so accurate. Engineers could assume that what you ask the mask writer to do will be what is on the mask. That is no longer the case when shapes are less than 80nm and more curvilinear,” said Fujimura.

At the 20 nm node, and even at the 28nm node, design teams need to evaluate the mask features at the wafer plane, and mask shops need to understand wafer-level effects as well. Previous efforts to do that involved lithography simulation with estimations (corner rounding) of the impact at the wafer level. That bundled model is running out of steam, he said.

Mask shapes have to be simulated to understand what is going to happen on the wafer. First, the curvilinear mask shapes are simulated. As the simulated light source projects the shape on to the wafer surface, TrueMask DS creates an energy intensity map received by the wafer.

“As (SRAF) features become smaller than 80nm, engineers must understand what is going to print on the wafer. They must simulate what is on the mask, then simulate at the wafer level. The industry started with the bundled model, and now goes to a separated model with double simulation tools,” he said.

The D2S team built graphical acceleration into the TrueMask DS tool. Nvidia Inc. supports engineering applications, and modern graphics processing units (GPUs) are essential for interactive simulations. Fujimura said the what would take hours of compute time with conventional approaches can be reduced to tens of seconds with TruMask DS running on a graphics workstation.

Mask shapes are becoming more complicated at 20nm. (Source: IBM)

“The user experience is totally different,” he said. “The amount of space the designers can explore is much different. If you try to give a curvilinear shape in a conventional simulation program for a 5µm by 5µm area on the wafer, it will take hours and hours. With our GPU accelerated simulation engines we can do this in tens of seconds. There is a big difference from an engineer’s perspective. It provides an interactive space in which the engineer can explore in interactive time.”

Engineers can change the shapes in an exploratory manner, which he said can make a major difference in the “amount of completeness or thoroughness the engineer can explore.”

A slightly different shape, with perhaps a one shot increase on the mask, can make a major difference at the wafer level. With a double simulation tool, engineers can explore the tradeoffs of what is happening on the mask and what is happening on the wafer, he said.

Source: Handel Jones, IBS, Inc.

TrueMask DS arrives as mask complexity is exploding. Double patterning at critical layers is required in order to accommodate the SRAF features, which involve increasingly complex shapes. Some companies have publicly discussed the need for quintuple (5x) patterning. With SRAF complexity in some case going up by five times, and as many as five masks required to write one layer on the wafer, mask complexity can increase by 5X to 25X.

D2S started nine years ago with direct write lithography as its main market. Fujimura, who earlier worked in technical roles at Cadence Design, said the underlying physics of the VSB e-beam machines is the same for both direct write e-beam lithography and for mask writing. The D2S engineering team spent about three years on TrueMask DS, he said, and has a number of already-granted patents.

Because mask dimension are four times what appears on the wafer, he said the direct-write lithography community faced the accuracy challenge much earlier than the mask-writing sector. That gave D2S a head start on solving the simulation problems now faced at the mask level, including corrective technologies.

“Two generations later, the same problems we see in direct write we see on the masks. We prepared for this a long time ago,” he said.

Franklin Kalk, chief technology officer at Toppan Photomasks in Round Rock, Texas, said the TrueMask software offers features not seen to date. “In a small 5 by 5 micron area, you can change the size of the assist features and see how that works as a printed feature on the wafer. We have not seen that in the past, and it is pretty neat,” Kalk said. The tool is also helpful in identifying hot spots in local areas, he added.

RRAM R&D Advances Reported at MRS Meeting

Tuesday, May 24th, 2011

by Ed Korczynski

Resistance-change Random Access Memory (RRAM or ReRAM) devices continue to be developed at labs and fabs around the world, as seen by more than 40 papers at the spring Materials Research Society (MRS) spring meeting which was held April 25-29 in San Francisco, California. RRAMs are based on resistive switching in metal oxides, such as titantia and niobia, that show memristor properties. With single-digit nanosecond switching-speeds and 10-year non-volatile data retention, RRAMs may represent the future of solid-state memory after DRAM and Flash devices eventually reach scaling limits below 22nm half-pitch.

Technically, the other devices competing with RRAM for the future of memory are themselves based on changes in resistance. Phase-change memory (PCM) using GST material switches between low- and high-resistance states, but requires large drive currents to heat the material to effect the phase-change. Spin-transfer-torque RAM (STT-RAM) is also read as a change in resistance, but the cell size is relatively large. RRAM devices built using cross-point arrays could provide the smallest, fastest, leanest, and cheapest non-volatile memory chips.

Between oral presentations and posters, the Spring 2011 MRS Meeting showed many different groups using different switching materials for RRAMs:

8 – TiO

7 – NiO

6 – Zn0:metal

4 – SiO:Cu

3 – HfO:metal

3 – TMO:metal

3 – polymers

2 – TaO

2 – SrTiO

1 – CuO

1 – HfSiO

1 – WO

1 – solid electrolyte

42 + 11 more novel materials in session Q10

= 53 total RRAM presentations.

HP Labs RRAM Update

Stan Williams’ group at HP Labs has led the world in memristor and RRAM R&D using the titania family of materials as the switch since 2006. They claim that their champion device switches in <2ns, and has world-record endurance of >1.2E10 cycles. Stan Williams provided a keynote address to an MRS workshop last year, in which he explained how his group finally discovered that the conducting channel consists of a 1-2nm thin TiO2 tunnel barrier adjacent to a ~30nm thick “magneli-phase” Ti4O7 layer. Modulating the width of the tunnel barrier through diffusion of oxygen-vacancies controls the electrical resistance of the stack.

This year, HP Labs updated their titania work by reporting on two different electroforming mechanisms seen in the same 50nm × 50nm crossbar memristive device. A “soft” electroforming step uses <140µAmp at ~5V to create a high-resistance mode, while a “hard” electroforming step uses ~250µAmp at ~9V to create a low resistance mode. The two switching modes possessed opposite switching polarities that shared a metastable intermediate resistance state. The two modes can be explained by two switching layers at the top- and bottom-electrode interfaces:

  • intermediate state, the bottom layer is ON with conducting channels made of both oxygen-vacancies and charge-traps, while the top layer consists of a tunnel gap;
  • OFF state, both layers consist of tunnel gaps; and
  • ON state, the top layer is ON with conducting channels made of oxygen-vacancies, while the bottom layer consists of a tunnel gap.

J. Joshua (Jianhua) Yang, provided an update on HP Labs’s RRAM work by surprisingly stating that titanium-oxides have stability issues which may limit device lifetimes, but that tantalum-oxides are free of such issue. The titania family seems to show issues getting beyond 100-1000 cycles, due to excessive heating inside the switch material due to the tendency to apply overvoltage. The two phases of titania will react with each other during heating, so the ON/OFF resistance differences are not so stable. “You need stability, and larger oxygen stability in the materials,” explained Yang. Presumably, the world-record cycling performance using titania was achieved using careful limits on overvoltage.

To improve lifetime with overvoltage margin, HP now uses a tantalum-oxide switching layer, a platinum bottom-electrode, and a tantalum top-electrode. The company claims that this system should be scalable to <5nm, the switching speed is merely 5ns, and the resistance state should be stable for 10 years. TaOx as deposited is amorphous, and even after heating steps it may retain some amorphous character.

RRAM Electroforming Avoidance

The ability to create functional RRAMs without electroforming would provide a significant cost and yield advantage in manufacturing. Though there is still debate as to the exact nature of the solid-state ion-diffusion mechanism(s) responsible for the change in resistance, it is clear that proper stacks of nano-scale oxides and sub-oxides are needed. Consequently, once trial-and-error has identified an ideal materials stack, it is likely that a wafer-scale process flow will be found to create the desired stack without the need for electroforming. For example, annealing in a reducing ambient or solid-phase gettering techniques may be used to adjust the stoichiometry of thin-films.

Using a tungsten-plug from a 90nm node DRAM process flow as one electrode, researchers from Research Center Juelich (with funding from Intel) used TiO2 thickness of 25nm and a Pt/Ti top electrode to make inherently electroforming-free RRAMs (Session Q8.4). Initially the devices were found to be in an intermediate state, and can be SET with positive bias voltage to the low resistance state (LRS). Without bias the intermediate state undergoes a RESET process to a high resistance state (HRS). Under negative voltage bias both processes can be reversed and the device returns into the intermediate state. This flipping of the SET and RESET process from positive to negative bias voltage polarity and vice versa can repeatedly be adjusted in one device. This versatile switching scenario is possible due to the use of the low-workfunction Ti and W electrodes which result in low barriers to the oxide.

The Juelich process flow is as follows:

  1. Plasma etch to clean the W plug,
  2. Reactive sputter TiO2 (300W, 46sccm AR, 17 sccm O2), and
  3. PVD of top-electrode.

The top-electrode was 30nm Pt with an optional 5nm layer of Ti or W below. “As long as there is a Pt/TiO2 interface we need forming,” explained Rainer Bruchhaus of Juelich. However, when using either W or Ti as a barrier between the Pt and TiO2 (while maintaining W as bottom electrode) they see no need for electroforming. In all cases, the voltage range is limited to +- 1V.

RRAM scalability

Much of the global interest in RRAM structures is due to the ability of cross-point memory architectures to be shrunk far more easily than other device structures. The process flow to make cross-point arrays is particularly attractive from an overlay perspective, since the top- and bottom-electrodes are perpendicular to each other and the switching material is patterned along with the top-electrode.

The world record for the smallest resistive memory element is currently held by the National Nano Device Laboratories (NNDL) in Taiwan, which showed a 9nm half-pitch functional RRAM at IEDM last December (Paper #19.1, “9nm Half-Pitch Functional Resistive Memory Cell with <1 µA Programming Current Using Thermally Oxidized Sub-Stochiometric WOx Film,” C. Ho et al, National Nano Device Laboratories, Taiwan/University of California at Berkeley). It features the lowest reported programming current to date of just <1µA using tungsten-oxide, compared to ~20mA for phase-change memories. The device was built using nano-injection lithography which employs a chemical reaction activated with a finely controlled electron beam to deposit a hard-mask for etching, but could have used Nano-imprint Lithography (NIL) or other patterning to form the array.

For more details on the physics of these devices, Applied Physics A, Vol.A102, No.4 is a special issue on “Memristive and Resistive Devices and Systems,” and is now available for free download as individual PDFs.

Intel Going Vertical for 22nm Transistors

Wednesday, May 4th, 2011

By David Lammers

Four years after making a shift to high-k dielectrics, the world’s largest semiconductor company has done it again, this time saying “bye bye” to the planar transistor design. Intel Corp. said Wednesday (May 4) it has succeeded in what senior fellow Mark Bohr called “a radical redesign” of the basic transistor structure at the 22nm node, moving to a tri-gate 3D structure that he said will support sharply lower operating voltages.

Mark Bohr

“The real advantage of going off into the third dimension is lower voltages, lower leakage,” Bohr said, adding that Intel estimates the wafer-level cost adder to be only 2-3 percent higher than for a planar transistor.

Bohr, along with Intel senior vice president Bill Holt and Intel Architecture general manager Dadi Perlmutter, demonstrated working servers, desktops and notebooks based on the upcoming “Ivy Bridge” line of MPUs based on the 22nm technology, expected to be in consumers’ hands early next year.

Bohr noted that all of the transistors on Intel’s 22nm products will use the tri-gate structure, casting aside earlier speculation that Intel might adopt a hybrid planar/finFET approach. (SemiMD reported on March 22 that Intel would go to a FinFET technology at the 22nm node.) And he said transistor performance could be varied by using six fins for some devices and only two on others, for example. The SRAM transistors would use a somewhat modified version of the tri-gate than the logic transistors, he added.

Bohr said Intel will again deploy a tri-gate design at the 14nm node, possibly with a taller fin to increase performance further. By going from a nominal 22nm design rule to 14nm, Intel may achieve a higher-than-normal increase in transistor density compared with previous technology transitions.

Bohr said Intel decided early on that for its 22nm technology it would need to move beyond the planar channel that has served the chip industry for the past 50 years. By wrapping the gate around a conducting channel that includes the top and two sides of the tall, narrow fin, Bohr said Intel is able to gain better control of the channel, drive more current, and sharply reduce power consumption.

Source: Intel

Compared with Intel’s best 32nm planar transistors, the 22nm “3D” device achieves 37 percent higher performance at .7 V operation, a Vdd that is largely impractical for planar structures. Later in his presentation, Bohr said the tri-gate structure would deliver roughly the same gate delay, but at .2 V lower supply voltages, or 0.8 V. At the same voltage as a planar transistor, the tri-gate will deliver “dramatic performance gains,” Bohr said.

“A 22nm tri-gate can deliver the same performance as 32nm planar, but at 0.8V instead of 1.0V, providing more than a 50 percent active power reduction,” Bohr said.

Bohr gave the assembled reporters a short tutorial on transistor device physics, saying that with planar devices a weak voltage on the substrate layer prevented the optimum sub-threshold voltage swing. With fully depleted silicon-on-insulator (SOI) devices, Bohr said the main challenge was wafer cost. With the ultra thin body SOI technology which STMicroelectronics and others are promoting, Bohr said bringing the buried oxide layer much closer to the silicon surface requires close wafer-manufacturing controls. “Those extremely thin (silicon and BOX layer) SOI wafers are available, but they are very expensive, and pretty hard to get,” Bohr said. Intel’s estimate is that using a thin-layered SOI wafer would add 10 percent to the finished wafer cost. (The SOI camp argues that fewer isolation and other steps translate into fewer masks, equalizing the wafer cost adder.)

Source: Intel Corp.

Perlmutter said Intel can operate its products at lower voltages and get “way lower power, while still getting to half the transistor size” compared with the 32nm planar technology. Intel has struggled to get its Atom line of SoC products adopted, partly because of lower power budgets for the ARM-based mobile SoCs. Perlmutter said Intel would move more quickly than in the past, bringing the Atom-based products on to the 22nm manufacturing platform fairly quickly compared with the 45nm and 32nm generations.

The first products using the tri-gate transistors will be a dual-core Ivy Bridge design. But he said the mobile products supported by the Atom core need the tri-gate technology. “It is extremely needed. It delivers more ‘power-full’ performance and more ‘power-less’ power consumption,” he quipped.

Dan Hutcheson, CEO of market research firm VLSI Research Inc, said the shift to a tri-gate structure is “truly a historic event,” coming some 50-plus years after Bob Noyce, Jack Kilby and others developed the first planar transistors. “This is like delivering the advantages of two nodes in one,” Hutcheson said.

Dean Freeman, an analyst at Gartner Inc., said “this is a big coup for Intel.”

The early shift to a tri-gate architecture “does give Intel a crack at the mobile device market, as the power consumption is very good. The performance capability should blow ARM devices out of the water.”

TSMC, which manufactures many of the ARM-based SoCs for the mobile chipset vendors, will “follow Intel’s lead to finFETs, but likely at 14nm. I don’t think IBM will hit finFETs until 14 as well,” Freeman said.

There are several manufacturing challenges with finFETs, the Gartner analyst said. The lithography tools must be able to print the feature size with the required alignment. “It was thought that EUV was going to be needed for this but it is possible that the overlay ASML and Nikon are achieving now will allow them to be successful,” Freeman said.

Sidewall doping is another challenge. “While the plasma immersion does a fairly good job there have been concerns regarding uniform doping density on the side wall of the source and drain,” he said.

Sidewall roughness — always an issue at leading edge design rules — can be a particularly tough issue for finFETs during etching of the poly or silicon line, he said.

Intel said its 22nm Trigate design performs well at low voltage operation.

Early Views on the Future of 1D Lithography

Thursday, March 17th, 2011

by Ed Korczynski

Many presentations at SPIE Advanced Lithography this year focused on the need to shift from 2D to essentially 1D layouts in masks as double-patterning is pushed to ever smaller geometries. For the third year in a row Valery Axelrad of Sequoia Design Systems and Michael Smayling of Tela Innovations presented results from collaborations. Canon has been working with both companies for some time now. The update this year was a combined presentation from all three companies entitled, “Optical lithography applied to 20nm CMOS logic and SRAM” [7973-39].

Patterning 20nm node chips with 193nm lithography is difficult even with immersion technology, since the Metal-1 (M1) pitch will be ~64nm, which is well below the 80nm limit for single exposure. Pushing the limits is possible with double-patterning (DP) when each pattern to essentially a 1D layout: Gridded Design Rules (GDR) to make uniform arrays, followed by a “cut” pattern of selectively placed orthogonal line segments. The cut layer thus becomes the most critical in terms of lithographic parameters, with similarities to the hole patterns used in contact layers. For both critical layers, density variations arise due to differences between logic and memory areas.

With Optical Proximity Correction (OPC) now at the limit, source-mask optimization (SMO) improves margins at the resolution limit, but can only make major improvements to small cells or repetitive designs like memory. OPC has been used for full-chip manufacturability improvements at previous technology nodes, but will not converge these days. “Convergence problems always arise when you have near neighbors and correlations between them,” explained Axelrad.

The authors also considered fundamental lithographic manufacturability parameters such as Depth of Focus (DOF), Normalized Illumination Log Slope (NILS), and Mask Error Enhancement Factor (MEEF) before and after SMO. Working with Canon steppers, realistic lens distortions using experimentally obtained Jones-Zernike expansions as well as realistic entrance pupil illumination were obtained as inputs to models.

Co-Optimization of Layout and Lithography

Simultaneous optimization of layout patterns and lithography settings is made possible by the uniformity and repeatability of the lines/cuts patterns. Optimization variables for the cut layer include the cut geometry (width, height, serifs), illumination of the scanner lens entrance pupil, and grouping cuts in similar optical environments to allow for local OPC. The optimization was for the CD error across all cuts, which also reduces variation among cuts by getting all CDs close to the same target value. This reduction of variation substantially simplifies the layout and OPC and produces manufacturable designs including both SRAM and logic.

There are many ways to formalize GDR+cut DP litho, but Tela and partners propose the following 1D rules :

  • Highly uniform 1D GDR layouts with sparse identical cuts,
  • critical layers are cuts,
  • all cuts identical to each other and tripled to ensure yield,
  • cuts also on a fixed grid (avoiding difficult neighborhoods),
  • interactions between cuts sufficiently small for local iterative OPC to converge using SMO, and
  • Use of a M0 layer to reduce the number of cuts and improve uniformity of cut density.

An algorithm was developed to resolve OPC and SMO for critical cut and hole layers:

STEP1: SMO (a.k.a. “co-optimization”) to find optimal cut shape and size, and illumination of the scanner lens entrance pupil (source), using a small representative sample portion of the layout.

STEP2: Local layout correction (pseudo-OPC) using information from Step1 to create the ideal size for the rectangles at each location, some a little smaller and some a little larger. Typically only 3-5 iterations are needed reach <1 nm RMS CD for a 42 nm target CD, which takes 30-60 seconds on a quad-core CPU, for a total simulation time of ~2 hours on a single CPU for ~120 windows.

The test chip is a 100k MOSFET including 50 different standard cells for SRAM and logic, in 50 x 60 microns area, using a 3 x 3 microns SMO sample window. The optimal illumination is a horizontal dipole. Axelrad claimed that after this extensive Source-Mask Optimization (SMO) the critical dimension (CD) error could be <1 nm at best focus conditions for both logic and SRAM cells at the 20nm node.

EUV May Be Too Late for Intel’s 10nm DR

Tuesday, March 1st, 2011

By Ed Korczynski

UPDATED

To know what’s happening in lithography for high-volume manufacturing (HVM) the SPIE Advanced Lithography conference and exhibit is the place to be. Presentations at the Nikon Precision and KLA-Tencor customer events the day before provide vital context. On Day 0 of the conference, Intel fellow Sam Sivakumar said EUV is too late for Intel’s 14nm node, and may be too late for the development of 10nm generation design-rules (DR). EUV could still be on time for single-exposure work in 16/14nm nodes at foundries and memory fabs, and many companies may use EUV to cut grid-lines made using 193i tools.

Before the industry can get to high-volume manufacturing (HVM) of commercial ICs in a fab, companies need to lock-in processes in pilot production. Before that, they must have design-rules (DR) set. Intel leads the world in the race to the smallest features, with the 32nm node in HVM, 22nm node now in pilot production, and 14nm node design rules already set for HVM in 2013. An Intel 10nm node in HVM would follow in 2015.

Sam Sivakumar (source: Intel)

At Nikon’s LithoVision workshop, Sam Sivakumar, Intel fellow (figure), explained that the DR set for 14nm used 193nm-immersion double-patterning (193i-DP), and that for the 10nm node—featuring 20nm actual line width, and 40nm pitch—design rules will be frozen early in 2013. “So production EUV tools will be delivered too late to meet the need to develop DR for the 10nm node, though Intel remains committed to going into production with EUV” said Sivakumar. Regarding the possibility of re-insertion, it is possible but only after surmounting a barrier. “We’d need to reset the DR for EUV,” elaborated Sivakumar, “because it doesn’t make sense to use DR developed for 193i with EUV. The key point is that DR flexibility needs to be built in, so that we can smoothly insert EUV and derive maximum benefit.”

[UPDATE 3/1: In an evening panel session, Sivakumar asserted Intel's official position as, “Our primary plan is to use EUV for 10nm, but we need ArF double-patterning as a backup.” Intel will have a pre-production 3100 tool this year, and likely will want a production 3300 whenever available. “When going to immersion, it took us well over a year to be able to get the defectivity levels down to that of dry. I'm hoping that all the learnings that will come from the 3100 will map to the 3300.”]

[UPDATE 3/2: In an exclusive followup meeting with SemiMD, Sivakumar explained that Intel has long planned to do 14nm node pilot using EUV, and should be on schedule with the shipment of the 3100 to meet plans. Many of the learnings to be found during pilot, such as SMO-dependencies, should map to HVM so there is confidence that the technology will be capable of ramping into 10nm node production.]

Discussing lithographic CoO for 22nm node patterning, Hidetami Yaegashi of TEL showed data that 193i double-patterning (193i-DP) should be less than EUV running at 150 wph and perhaps only 50% of EUV running at 60 wph.

Any delays in EUV seem to be due to the tough science and engineering challenges associated with sources and resists, while stepper OEMs have been meeting their development commitments.

Part of the main body of a ASML NXE3100 "pre-production" EUV lithography tool being installed at IMEC (source: IMEC)

Leading off Day 1, Luc Van den hove, IMEC president and CEO, announced in his plenary keynote that ASML started shipping the new NXE: 3100 “pre-production” EUV stepper/scanner to IEC last week, using 20 trucks. “The body is being installed even as we speak here,” (figure) announced Van den hove. Source and resist improvements could get us to 6o wph in another year, but all bets are off the table for when ASML could double that. He also said that flare in the new tool is only ~4% compared to 8-10% for the “alpha-demo-tool” first installed.

Next in the morning was the plenary keynote by Shang-yi Chiang, senior vice president of R&D at TSMC, who said “most people believe that Moore’s Law is nearing the end…whether we can extend Moore’s Law into the next decade is in your hands.” The eventual limit will be economic, not technical. “Within transistor and interconnect technology developments we do not see any roadblocks,” he explained. “So the lithography cost is the single greatest factor which may limit our ability to extend Moore’s Law into the next decade.” TSMC’s CoO modeling indicates that 100-150wph EUV should cost less than 193i-DP for 14nm nodes and beyond.

Franklin Kalk, Toppan Photomasks VP, met this afternoon with SemiMD to discuss the many known challenges with lithography for the 22nm node and beyond. Kalk sees pragmatic evolution of optical technologies continuing. Metaphorically speaking, we’re not about to crash into the ground. “I feel like we’re going to land and everything will be OK,” reassured Kalk. “But we may need reverse thrusters to not run off the runway, and we may land on one wheel and bounce a bit.”