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Blog review May 5, 2014

Jeremy Read of Applied Materials writes that while some consumer IoT applications will require semiconductors manufactured using cutting-edge technologies the vast majority of chips will be used in client-side applications. These chips, such as a sensor monitoring room temperature in a connected HVAC system, require processing capabilities that can be met using legacy process (90 and 45nm) technologies manufactured on 200mm wafers.

Ali Khakifirooz of Spansion notes that body biasing has been long considered as an effective and relatively easy way to compensate for some of the process variations. Not only does it lead to a tighter performance distribution and better yield, but also by mitigating the guardband requirements for process corners and temperature variation, it leads to better performance and faster design cycle.

Frank Feng of Mentor Graphics blogs that transistor and gate levels of library design are normally delivered fully vetted for reliability issues such as electrostatic discharge (ESD), latch-up, electrical overstress (EOS), and dielectric breakdown. However, when designers assemble transistors and gates into intellectual property (IP), blocks, or whole chip designs, they encounter a variety of reliability problems generated across interconnect layers or across device regions of PSUB and NWELL bodies.

Phil Garrou has not been predicting the end of the world, but rather the end of electronics as we know it, i.e.,relying on CMOS scaling. He blogs that it was with great anticipation that he perused the 2013 ITRS roadmap that was released a few weeks ago. He is happy to tell you they are facing the challenges head on although the ultimate solutions are, as we might expect, not yet crystal clear.

Pete Singer writes that the newly revamped International Technology Roadmap for Semiconductors was released in early April. It’s actually called the 2013 ITRS, which makes it seem already out of date, but that’s the way the numbering has always been. The latest ITRS highlights 3D power scaling, system level integration and a new chapter on big data.



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