Frontiers of Metrology Conference Set for Grenoble
The International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2011 (IC-FCMN 2011) is planned for Grenoble, France on May 23-26, the first time in eight meetings the conference is being held outside the United States.
The characterization and metrology conference will be held at the Minatec center for nanotechnologies in Grenoble.
Registration information is available on the National Institute of Standards and Technology (NIST) site.
